Researchers from USA and India have developed micro-metalenses to detect microscopic defects, addressing a need across industries for precise material testing. A research team from Indian Institute of Technology (IIT) Madras, India and Intelligent Optical Systems, USA, have achieved a groundbreaking advancement in material diagnostics through high-resolution ultrasonic imaging. Traditional methods like X-ray imaging offer high […]
View more at https://www.electronicsforu.com/news/silicon-metalenses-attains-high-resolution-defect-detection.
Credit- EFY. Distributed by Department of EEE, ADBU: https://tinyurl.com/eee-adbu
Curated by Jesif Ahmed
