Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, proudly announces the launch of the Ultra-High Speed 3D AOI, TR7700QH SII. With 15 μm high resolution, 21 MP imaging, and Large FOV inspection, TR7700QH SII sets a new standard for inspection performance. Operating at Ultra-high speeds of up […]
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Credit- EFY. Distributed by Department of EEE, ADBU: https://tinyurl.com/eee-adbu
Curated by Jesif Ahmed
