Keysight Technologies, Inc. introduces the PZ2100 Series High-Channel Density Precision Source Measure Unit (SMU) Solution, a new SMU solution giving digital development engineers 20 precision SMU channels within a 1U rack space to speed the characterization of integrated circuit (IC) designs. While innovation cycles are shortening and digital standards are evolving, designing a semiconductor component […]
The post Keysight Introduces High Density Source Measure Unit To Speed Semiconductor Characterization appeared first on Electronics For You.
View more at https://www.electronicsforu.com/press-releases/keysight-introduces-high-density-source-measure-unit-to-speed-semiconductor-characterization.
Credit- EFY. Distributed by Department of EEE, ADBU: https://tinyurl.com/eee-adbu
Curated by Jesif Ahmed